Articles dans des revues avec comité de lecture (3)

J. Pelzl , Mihai CHIRTOC , R. Meckenstock
Thermal wave-based scanning probe microscopy and its applications, Int. J. Thermophysics 34, 1353-1366 (2013).

P. Kijamnajsuk , M. Möller , R. Meckenstock , D. Spoddig , Mihai CHIRTOC , J. Pelzl
Simultaneous Measurement of Local Magnetic and Thermal Parameters by ThermalWave Scanning Microscopy, Int J Thermophys DOI 10.1007/s10765-012-1308-8, Sept. 2012

Mihai CHIRTOC , X. Filip , Jean-François HENRY , Jean-Stéphane ANTONIOW , I. Chirtoc , D. Dietzel , R. Meckenstock , J. Pelzl
Thermal probe self-calibration in ac scanning thermal microscopy, Superlattices and Microstructures 35, pp. 305-314 (2004).

Communications avec actes (1)

Jean-Stéphane ANTONIOW , F.H. Lei , Mihai CHIRTOC , I. Chirtoc , D. Dietzel , R. Meckenstock , Nathalie Trannoy-Orban , J. Pelzl
Mise en oeuvre d’une détection pyroélectrique en microscopie en champ proche, Thermique et Microtechnologies, Actes du Congrès Annuel de la Societé Française de Thermique, SFT, 3-6.06.2003, Grenoble, France, Ph. Marty, A. Bontemps, S. Le Person and F. Ayela, Eds., Elsevier, Paris 2003, ISBN 2-84299-478-7, pp. 961-966

Conférences invitées (2)

J. Pelzl , R. Meckenstock , D. Dietzel , J. Gibkes , Mihai CHIRTOC , Jean-François HENRY , Jean-Stéphane ANTONIOW
Investigation of nano-structured semiconductor, magnetic and mechanical devices by thermal wave based microscopy, Proc. Int. Workshop on Nanoscience & Nanotechnology IWON 2005 Belgrade, Serbia and Montenegro, 15-18.11.2005, pp. 7-16 (presented by J. Pelzl)

Jean-Stéphane ANTONIOW , Mihai CHIRTOC , F. Lei , D. Dietzel , R. Meckenstock , Nathalie Trannoy-Orban , J. Pelzl
(Photo-)thermal imaging using a modified atomic force microscope (AFM) combined with pyroelectric detection", Canadian Association of Physics (CAP), Congress, Univ. of Manitoba, Winnipeg, Canada, 13-16.06.2004 (presented by J.S. Antoniow)