Articles dans des revues avec comité de lecture (2)

S. Pavageau , G. Tessier , B. Charlot , C. Filloy , D. Fournier , B. Cretin , S. Dilhaire , S. Gomès , Nathalie Trannoy-Orban , P. Vairac , S. Volz
Quantitative thermoreflectance imaging : Calibration method and validation on a dedicated integrated circuit, IEEE Transactions on Components and Packaging Technologies, 30 (4), pp. 604-608 (2007)

S. Gomès , O. Chapuis , F. Nepveu , Nathalie Trannoy-Orban , S. Volz , B. Charlot , G. Tessier , S. Dilhaire , B. Cretin , P. Vairac
Temperature study of sub-micrometric ICs by scanning thermal microscopy, IEEE Transactions on Components and Packaging Technologies, 30 (3), pp. 424-431 (2007)

Communications avec actes (4)

S. Gomès , O. Chapuis , F. Nepveu , Nathalie Trannoy-Orban , S. Volz , B. Charlot , G. Tessier , S. Dilhaire , B. Cretin , P. Vairac
Temperature measurement of Microsystems by scanning thermal microscopy, Therminic, Belgirate, Italy (28-30 Sept. 2005), 4 pages

G. Tessier , S. Pavageau , C. Filloy , B. Charlot , G. Jerosolimski , D. Fournier , B. Cretin , S. Dilhaire , Nathalie Trannoy-Orban , P. Vairac , S. Volz
Quantitative thermoreflectance imaging : calibration method and validation on a dedicated integrated circuit, Therminic, Belgirate, Italy (28-30 September 2005), 5 pages

S. Grauby , A. Salhi , L.D. Patino Lopez , S. Dilhaire , B. Charlot , W. Claeys , B. Cretin , G. Tessier , Nathalie Trannoy-Orban , P. Vairac , S. Volz
Temperature variations imaging by thermoreflectance and SThM techniques, Therminic, Belgirate, Italy (28-30 September 2005), 4 pages

P. Vairac , B. Cretin , B. Charlot , S. Dilhaire , S. Gomès , G. Tessier , Nathalie Trannoy-Orban , S. Volz
Ultra-Local temperature mapping with an intrinsic thermocouple, Therminic, Belgirate, Italy (28-30 September 2005), 3 pages